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ERIC Number: EJ361444
Record Type: CIJE
Publication Date: 1987
Pages: 10
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: ISSN-0194-3081
The Other Side of Assessment.
Hirsch, Peter M.
New Directions for Community Colleges, n59 p15-24 Fall 1987
Explores the relationship between mandates for educational excellence and more rigorous standards and the community college's role in providing access to educational opportunity for all students. Underscores the difference between accountability-based assessment and compliance-based testing. (DMM)
John Wiley & Sons, Inc. Subscription Department, 111 River Street, Hoboken, NJ 07030-5774. Tel: 800-825-7550; Tel: 201-748-6645; Fax: 201-748-6021; e-mail: subinfo@wiley.com; Web site: http://www3.interscience.wiley.com/browse/?type=JOURNAL
Publication Type: Journal Articles; Opinion Papers
Education Level: N/A
Audience: Practitioners
Language: English
Sponsor: N/A
Authoring Institution: N/A