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ERIC Number: EJ265282
Record Type: CIJE
Publication Date: 1981-Dec
Pages: N/A
Abstractor: N/A
Reference Count: N/A
ISBN: N/A
ISSN: N/A
A New Look at Bias in Aptitude Tests.
Scheuneman, Janice Dowd
New Directions for Testing and Measurement, n12 p3-35 Dec 1981
Statistical bias in measurement and ethnic-group bias in testing are discussed, reviewing predictive and construct validity studies. Item bias is reconceptualized to include distance of item content from respondent's experience. Differing values of mean and standard deviation for bias parameter are analyzed in a simulation. References are included. (CM)
Publication Type: Journal Articles; Information Analyses; Opinion Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A