ERIC Number: EJ1185156
Record Type: Journal
Publication Date: 2018-Aug
Pages: 21
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0010-4086
EISSN: N/A
Available Date: N/A
International Tests, National Assessments, and Educational Development (1970-2012)
Ramirez, Francisco O.; Schofer, Evan; Meyer, John W.
Comparative Education Review, v62 n3 p344-364 Aug 2018
Recent decades have seen rapid growth of national participation in international tests as well as expanded national assessment testing. This article addresses the relationship between these forms of testing and educational developments: educational enrollments, women's participation in schooling, repetition rates, student centrism in the curriculum, and the breadth of the curriculum. From a critical perspective, the obsession with international and national assessment testing might be linked to lower enrollments, higher repetition rates, and a narrowing of curricula. We use panel regression models with country fixed effects to examine these relationships. Our findings do not support these dire predictions. We offer an alternative interpretation that situates the global testing regime within a broader world educational culture that favors both a technocratic approach to assessing learning and such progressive educational outcomes as expanded access and broader curricula.
Descriptors: International Assessment, Comparative Education, Womens Education, Educational Development, Enrollment Trends, National Competency Tests, Grade Repetition, Regression (Statistics), Outcomes of Education, Access to Education, Global Approach, Student Evaluation, Educational History
University of Chicago Press. Journals Division, P.O. Box 37005, Chicago, IL 60637. Tel: 877-705-1878; Tel: 773-753-3347; Fax: 877-705-1879; Fax: 773-753-0811; e-mail: subscriptions@press.uchicago.edu; Web site: http://www.press.uchicago.edu
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Author Affiliations: N/A

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