ERIC Number: EJ1156606
Record Type: Journal
Publication Date: 2014
Pages: 13
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-1939-1382
EISSN: N/A
Maximum Clique Algorithm and Its Approximation for Uniform Test Form Assembly
Ishii, Takatoshi; Songmuang, Pokpong; Ueno, Maomi
IEEE Transactions on Learning Technologies, v7 n1 p83-95 Jan-Mar 2014
Educational assessments occasionally require uniform test forms for which each test form comprises a different set of items, but the forms meet equivalent test specifications (i.e., qualities indicated by test information functions based on item response theory). We propose two maximum clique algorithms (MCA) for uniform test form assembly. The proposed methods can assemble uniform test forms with allowance of overlapping items among uniform test forms. First, we propose an exact method that maximizes the number of uniform test forms from an item pool. However, the exact method presents computational cost problems. To relax those problems, we propose an approximate method that maximizes the number of uniform test forms asymptotically. Accordingly, the proposed methods can use the item pool more efficiently than traditional methods can. We demonstrate the efficiency of the proposed methods using simulated and actual data.
Descriptors: Simulation, Efficiency, Test Items, Educational Assessment, Item Analysis, Item Response Theory, Computer Assisted Testing, Computer Software, Programming, Comparative Analysis, Foreign Countries
Institute of Electrical and Electronics Engineers, Inc. 445 Hoes Lane, Piscataway, NJ 08854. Tel: 732-981-0060; Web site: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4620076
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Location: Japan
Grant or Contract Numbers: N/A