NotesFAQContact Us
Collection
Advanced
Search Tips
Peer reviewed Peer reviewed
Direct linkDirect link
ERIC Number: EJ1143155
Record Type: Journal
Publication Date: 2017
Pages: 25
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0022-0655
EISSN: N/A
Evaluating Statistical Targets for Assembling Parallel Mixed-Format Test Forms
Debeer, Dries; Ali, Usama S.; van Rijn, Peter W.
Journal of Educational Measurement, v54 n2 p218-242 Sum 2017
Test assembly is the process of selecting items from an item pool to form one or more new test forms. Often new test forms are constructed to be parallel with an existing (or an ideal) test. Within the context of item response theory, the test information function (TIF) or the test characteristic curve (TCC) are commonly used as statistical targets to obtain this parallelism. In a recent study, Ali and van Rijn proposed combining the TIF and TCC as statistical targets, rather than using only a single statistical target. In this article, we propose two new methods using this combined approach, and compare these methods with single statistical targets for the assembly of mixed-format tests. In addition, we introduce new criteria to evaluate the parallelism of multiple forms. The results show that single statistical targets can be problematic, while the combined targets perform better, especially in situations with increasing numbers of polytomous items. Implications of using the combined target are discussed.
Wiley-Blackwell. 350 Main Street, Malden, MA 02148. Tel: 800-835-6770; Tel: 781-388-8598; Fax: 781-388-8232; e-mail: cs-journals@wiley.com; Web site: http://www.wiley.com/WileyCDA
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A