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ERIC Number: EJ1132361
Record Type: Journal
Publication Date: 2017
Pages: 18
Abstractor: As Provided
Reference Count: 40
ISBN: N/A
ISSN: ISSN-0895-7347
The Consequences of Ignoring Item Parameter Drift in Longitudinal Item Response Models
Lee, Wooyeol; Cho, Sun-Joo
Applied Measurement in Education, v30 n2 p129-146 2017
Utilizing a longitudinal item response model, this study investigated the effect of item parameter drift (IPD) on item parameters and person scores via a Monte Carlo study. Item parameter recovery was investigated for various IPD patterns in terms of bias and root mean-square error (RMSE), and percentage of time the 95% confidence interval covered the true parameter. The simulation results suggest that item parameters were not recovered well when IPD was ignored, especially if there was a larger number of IPD conditions. In addition, coverage was not accurate in all IPD conditions when IPD is ignored. Also, the results suggest that the accuracy of person scores (measured by bias) is potentially problematic when the larger number of IPD items is ignored. However, the overall accuracy (measured by RMSE) and coverage were unexpectedly acceptable in the presence of IPD as defined in this study.
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Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A