NotesFAQContact Us
Collection
Advanced
Search Tips
Peer reviewed Peer reviewed
Direct linkDirect link
ERIC Number: EJ1063563
Record Type: Journal
Publication Date: 2015-Jun
Pages: 22
Abstractor: As Provided
Reference Count: N/A
ISBN: N/A
ISSN: ISSN-0022-0655
Transforming SIBTEST to Account for Multilevel Data Structures
French, Brian F.; Finch, W. Holmes
Journal of Educational Measurement, v52 n2 p159-180 Sum 2015
SIBTEST is a differential item functioning (DIF) detection method that is accurate and effective with small samples, in the presence of group mean differences, and for assessment of both uniform and nonuniform DIF. The presence of multilevel data with DIF detection has received increased attention. Ignoring such structure can inflate Type I error. This simulation study examines the performance of newly developed multilevel adaptations of SIBTEST in the presence of multilevel data. Data were simulated in a multilevel framework and both uniform and nonuniform DIF were assessed. Study results demonstrated that naïve SIBTEST and Crossing SIBTEST, ignoring the multilevel data structure, yield inflated Type I error rates, while certain multilevel extensions provided better error and accuracy control.
Wiley-Blackwell. 350 Main Street, Malden, MA 02148. Tel: 800-835-6770; Tel: 781-388-8598; Fax: 781-388-8232; e-mail: cs-journals@wiley.com; Web site: http://www.wiley.com/WileyCDA
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: Institute of Education Sciences (ED)
Authoring Institution: N/A
IES Funded: Yes
Grant or Contract Numbers: R305D110014