NotesFAQContact Us
Search Tips
Peer reviewed Peer reviewed
Direct linkDirect link
ERIC Number: EJ1056796
Record Type: Journal
Publication Date: 2015
Pages: 14
Abstractor: As Provided
Reference Count: 69
ISSN: ISSN-0895-7347
Using Testlet Response Theory to Examine Local Dependence in C-Tests
Eckes, Thomas; Baghaei, Purya
Applied Measurement in Education, v28 n2 p85-98 2015
C-tests are gap-filling tests widely used to assess general language proficiency for purposes of placement, screening, or provision of feedback to language learners. C-tests consist of several short texts in which parts of words are missing. We addressed the issue of local dependence in C-tests using an explicit modeling approach based on testlet response theory. Data were provided by a total sample of 4,708 participants working on eight C-test texts with 20 gaps each. The resulting parameter estimates were compared to those obtained from (a) a polytomous item response theory (IRT) model and (b) a standard IRT model that ignored the dependence structure. Testlet effects proved to be very small and correspondence between parameters obtained from the different modeling approaches was high. When local dependence was ignored reliability of the C-test was slightly overestimated. Implications for the analysis of testlets in general, and C-tests in particular are discussed.
Routledge. Available from: Taylor & Francis, Ltd. 325 Chestnut Street Suite 800, Philadelphia, PA 19106. Tel: 800-354-1420; Fax: 215-625-2940; Web site:
Publication Type: Journal Articles; Reports - Research
Education Level: Higher Education; Postsecondary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A