Peer reviewed
ERIC Number: EJ101554
Record Type: CIJE
Publication Date: 1974
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Laboratory Experiment in Semiconductor Surface-Field Effects
Goodman, F. R.; And Others
American Journal of Physics, 42, 7, 572-579, Jul 74
A laboratory instructional program involving metal-insulator-semiconductor (MIS) devices is described. In the first of a two-part experiment, students become familiar with the important parameters of a simple MIS device and learn measurement techniques; in the second part, device fabrication procedures are learned. (DT)
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