NotesFAQContact Us
Collection
Advanced
Search Tips
Peer reviewed Peer reviewed
PDF on ERIC Download full text
ERIC Number: EJ1005684
Record Type: Journal
Publication Date: 2013
Pages: 12
Abstractor: ERIC
Reference Count: 28
ISBN: N/A
ISSN: ISSN-1045-1064
Social Adjustment of At-Risk Technology Education Students
Ernst, Jeremy V.; Moye, Johnny J.
Journal of Technology Education, v24 n2 p2-13 Spr 2013
Individual technology education students' subgroup dynamic informs progressions of research while apprising technology teacher educators and classroom technology education teachers of intricate differences between students. Recognition of these differences help educators realize that classroom structure, instruction, and activities must be conducive to all learners. These research findings are important in identifying technology education social competence characteristics of students at-risk and how they differ from a normative sample of student learners. The goal and intent of this exploratory research project was to identify the degree of social competence exhibited by technology education students identified as at-risk. Self-control, peer relations, school adjustment, and empathy categorizations provide a depiction of the level of social competence (Walker & McConnell, 1995). Supplemental to the social competence measure, linkages between peer relation and school adjustment competencies were gauged to determine associations. The following research questions guided this exploratory project: (1) Are there differences in social competence between technology education students considered at-risk and a normative student sample?; and (2) Is there competence measure association between social competence subscale elements (self-control, peer relations, school adjustment, and empathy) for technology education students identified as at-risk? (Contains 4 tables.)
Journal of Technology Education. Web site: http://scholar.lib.vt.edu/ejournals/JTE
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A