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ERIC Number: EJ011673
Record Type: CIJE
Publication Date: 1969
Pages: N/A
Abstractor: N/A
Reference Count: N/A
ISBN: N/A
ISSN: N/A
Overlap Between Achievement and Aptitude Scores
Strowig, R. Wray; Alexakos, C. E.
Meas Evaluation Guidance, 2, 3, 157-166, 69 Fall
Analysis of the variables measured on the General Aptitude Tests Battery and the Metropolitan Achievement Tests indicates that while achievement ratings are related to in-school and post-school success, aptitude testing may not be as effective a method as believed for vocational placement. Extensive literature review. Data tables. (CJ)
Publication Type: N/A
Education Level: N/A
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Sponsor: N/A
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