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ERIC Number: ED480138
Record Type: Non-Journal
Publication Date: 2003-Apr
Pages: 21
Abstractor: N/A
Reference Count: N/A
Connecting SEM Analysis and Profile Analysis via MDS.
Kim, Se-Kang; Davison, Mark L.
This study was designed to explain how Profile Analysis via Multidimensional Scaling (PAMS) could be viewed as a structural equations model (SEM). The study replicated the major profiles extracted from PAMS in the context of the latent variables in SEM. Data involved the Basic Theme Scales of the Strong Campbell Interest Inventory (Campbell and Hanse, 1985). Data were collected from 1,308 males, who were clients of a vocational assessment clinic. Findings show that the profile patterns identified by PAMS can be used to examine the relationships between the profile patterns and other criterion variables, but the results from a PAMS approach can only be used as an exploratory tool. The profile patterns can be examined in confirmatory factor analysis as shown by this study. Also, when major profiles identified in PAMS are replicated in SEM, one can examine whether significant test results of the coordinates in PAMS match those of factor loadings in SEM, since SEM analyses always provide asymptotic standard errors corresponding to estimates of parameters. (Contains 2 figures, 3 tables, and 14 references.) (SLD)
Publication Type: Reports - Research; Speeches/Meeting Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A