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ERIC Number: ED475831
Record Type: Non-Journal
Publication Date: 2003-Apr
Pages: 19
Abstractor: N/A
Reference Count: N/A
Exposure Control Using Adaptive Multi-Stage Item Bundles.
Luecht, Richard M.
This paper presents a multistage adaptive testing test development paradigm that promises to handle content balancing and other test development needs, psychometric reliability concerns, and item exposure. The bundled multistage adaptive testing (BMAT) framework is a modification of the computer-adaptive sequential testing framework introduced by R. Luecht and R. Nungester (1998). Under BMAT, banks of parallel testlets are constructed to meet various statistical targets and categorical constraints. BMAT requires automated test assembly (ATA) technology capable of handling multiple simultaneous objective functions and constraint systems. In addition to handling item exposure directly through ATA constraints on item overlap across testlets, BMAT incorporates random selection of the testlets and can allow randomization of the item presentation sequence within modules to thwart attempts at memorization and other forms of collaborative cheating. The result is a secure method of building high-quality adaptive and mastery tests that have sever constraints on test content. BMAT is demonstrated in the context of high-stakes professional certification. (SLD)
Publication Type: Reports - Descriptive; Speeches/Meeting Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A