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ERIC Number: ED435643
Record Type: Non-Journal
Publication Date: 1999-Sep
Pages: 34
Abstractor: N/A
Reference Count: N/A
ISBN: N/A
ISSN: N/A
Exploring the Relationship between Item Exposure Rate and Test Overlap Rate in Computerized Adaptive Testing.
Chen, Shu-Ying; Ankenmann, Robert D.; Spray, Judith A.
This paper presents a derivation of an average between-test overlap index as a function of the item exposure index, for fixed-length computerized adaptive tests (CAT). This relationship is used to investigate the simultaneous control of item exposure at both the item and test levels. Implications for practice as well as future research are also discussed. An appendix demonstrates that the expected value of the between-test overlap for a fixed-length CAT under completely randomized item selection, is equal to the fixed test length divided by the item pool size. (Contains 5 tables, 2 figures, and 12 references.) (Author/SLD)
ACT Research Report Series, PO box 168, Iowa City, IA 52243-0168.
Publication Type: Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: American Coll. Testing Program, Iowa City, IA.