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ERIC Number: ED429090
Record Type: RIE
Publication Date: 1998
Pages: 74
Abstractor: N/A
Reference Count: N/A
ISBN: N/A
ISSN: ISSN-1085-5300
Statistical Significance Testing.
McLean, James E., Ed.; Kaufman, Alan S., Ed.
Research in the Schools, v5 n2 Fall 1998
The controversy about the use or misuse of statistical significance testing has become the major methodological issue in educational research. This special issue contains three articles that explore the controversy, three commentaries on these articles, an overall response, and three rejoinders by the first three authors. They are: (1) "Introduction to the Special Issue on Statistical Significance Testing" (Alan S. Kaufman); (2) "The Data Analysis Dilemma: Ban or Abandon. A Review of Null Hypothesis Significance Testing" (Thomas W. Nix and J. Jackson Barnette); (3) "The Role of Statistical Significance Testing in Educational Research" (James E. McClean and James M. Ernest); (4) "Statistical Significance Testing: A Historical Overview of Misuses and Misinterpretation with Implications for the Editorial Policies of Educational Journals" (Larry G. Daniel); (5) "Statistical Significance and Effect Size Reporting: Portrait of a Possible Future" (Bruce Thompson); (6) "Comments on the Statistical Significance Testing Articles" (Thomas R. Knapp); (7) "What If There Were No More Bickering about Statistical Significance Tests?" (Joel R. Levin); (8) "A Review of Hypothesis Testing Revisited: Rejoinder to Thompson, Knapp, and Levin" (Thomas W. Nix and J. Jackson Barnette); (9) "Fight the Good Fight: A Response to Thompson, Knapp, and Levin" (James M. Ernest and James E. McLean); and (10) "The Statistical Significance Controversy Is Definitely Not Over: A Rejoinder to Responses by Thompson, Knapp, and Levin" (Larry G. Daniel). Each paper contains references. (SLD)
Publication Type: Collected Works - Serials
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: Mid-South Educational Research Association, MS.; Alabama Univ., Birmingham.
Note: For individual articles, see TM 521 737-746.