ERIC Number: ED422166
Record Type: Non-Journal
Publication Date: 1998-Jun-22
International Mobility of Scientists and Engineers to the United States--Brain Drain or Brain Circulation?
Johnson, Jean M.; Regets, Mark C.
SRS Issue Brief, Jun 22 1998
This Issue Brief reports on the international mobility of scientists and engineers to the United States and discusses student flows into the higher education system, the stay rates of foreign doctoral recipients, and their short and long term employment in United States industry, universities, and government. Information presented in the tables and graphs includes: (1) United States and foreign-born scientists and engineers in research and development in the United States in 1993 by sector and location of science and engineering degree; (2) stay rate of foreign students earning science and engineering doctorates at United States universities by selected regions from 1988-96; and (3) percentage of 1990-91 foreign science and engineering doctoral recipients from United States universities who were working in the United States in 1995 by country of origin. (DDR)
Descriptors: Brain Drain, Doctoral Degrees, Employment Patterns, Engineers, Foreign Workers, Higher Education, Labor Economics, Mobility, Occupational Mobility, Science and Society, Scientists, Underemployment
National Science Foundation, Division of Science Resources Studies, 4201 Wilson Blvd., Arlington, VA 22230; World Wide Web: http://www.nsf.gov/sbe/srs/stats.htm
Publication Type: Collected Works - Serials; Reports - Research
Education Level: N/A
Authoring Institution: National Science Foundation, Arlington, VA. Div. of Science Resources Studies.