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ERIC Number: ED412219
Record Type: Non-Journal
Publication Date: 1997-Mar
Pages: 27
Abstractor: N/A
Reference Count: N/A
ISBN: N/A
ISSN: N/A
Examining Local Item Dependence Effects in a Large-Scale Science Assessment by a Rasch Partial Credit Model.
Yan, Jean W.
Context-dependent items are traditionally analyzed independently, creating a situation in which the potential local item dependence effects among these items may cause a biased estimation of examinees' abilities. This study investigated the local item dependence effects on testlets in the tryout version of a statewide science assessment by a Rasch partial credit model. Cluster sampling combined with stratified sampling was used. Data were analyzed in five different configurations to study the relationships between context-dependent items at the individual item level and at the testlet level. It is shown that local dependence effects may be controlled and a better fit for testlet calibration can be obtained by employing the Rasch partial credit model for some, but not all testlets. (Contains 2 figures, 11 tables, and 35 references.) (Author/SLD)
Publication Type: Reports - Evaluative; Speeches/Meeting Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A