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ERIC Number: ED163018
Record Type: Non-Journal
Publication Date: 1978-Mar
Pages: 25
Abstractor: N/A
Reference Count: N/A
Application of Latent Trait Models to the Development of Norm-Referenced and Criterion-Referenced Tests.
Cook, Linda L.; Hambleton, Ronald K.
Latent trait models may offer considerable potential for the improvement of educational measurement practices, but until recently, they have received only limited attention from measurement specialists. This paper provides a brief introduction to latent trait models, and provides test practitioners with a non-technical introduction to the development of norm-referenced and criterion-referenced tests using latent trait models. Distinctions between standard test development procedures and test development procedures utilizing latent trait models are drawn. (Author/CTM)
Publication Type: Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A