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ERIC Number: ED139440
Record Type: RIE
Publication Date: 1977-May
Reference Count: 0
Workshop on Standards for Image Pattern Recognition. Computer Seience & Technology Series.
Evans, John M. , Ed.; And Others
Automatic image pattern recognition techniques have been successfully applied to improving productivity and quality in both manufacturing and service applications. Automatic Image Pattern Recognition Algorithms are often developed and tested using unique data bases for each specific application. Quantitative comparison of different approaches and extrapolation of existing techniques to new applications is difficult or impossible. To facilitate data interchange in this area a two day workshop was held at the National Bureau of Standards in Gaithersburg, Maryland on June 3 and 4, 1976. The workshop considered the issues involved with interchange of images as data in standard formats on magnetic tape. Specifically, the workshop addressed the following objectives: (1) to define mechanisms for achieving a standard format for magnetic tape interchange; (2) to define requirements for documentation of the recording environment of an image; (3) to recommend mechanisms for selecting and distributing prototype images; and (4) to consider the requirements and to explore the prospect for a language to describe image content and structure. (Author)
Descriptors: Agency Cooperation, Automation, Computer Graphics, Computer Programs, Coordination, Data Processing, Documentation, Programing Languages, Reprography, Standards, Workshops
Superintendent of Documents, U.S. Government Printing Office, Washington, D.C. 20402. (C13.10:500-8, Stock No. 003-003-01771-0, $2.50)
Publication Type: Collected Works - Proceedings
Education Level: N/A
Sponsor: Institute of Electrical and Electronics Engineers, Inc., New York, NY.; Electronic Industries Association, Washington, DC.; Association for Computing Machinery, New York, NY.
Authoring Institution: National Bureau of Standards (DOC), Washington, DC. Inst. for Computer Sciences and Technology.
Note: For related documents, see IR 004 900-904; Best copy available; Proceedings of a Workshop (Gaithersburg, Md., June 3-4, 1976)