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ERIC Number: ED041043
Record Type: RIE
Publication Date: 1970-May
Pages: 27
Abstractor: N/A
Reference Count: 0
The Unintentional Memory Load in Tests for Young Children.
Jones, Margaret Hubbard
The validity of certain standardized tests may be affected by the short-term memory load therein and its relation to a child's short-term memory capacity. Factors of testing which increase a test's memory load and consequently interfere with comprehension are discussed. It is hypothesized that a test which strains the short-term memory capacity of a child is functioning as an unintended screen to eliminate subjects with inferior memory capacities and does not adequately measure the intended ability. A number of tests randomly selected are examined in terms of three ways in which memory capacities can be overloaded in a test. In conclusion, since there does not appear to be a high correlation between memory skills and the other skills involved in the learning processes, it is recommended that memory skills be measured as such and that the other skills be assessed independently of the memory screen. A listing of tests is included. (PR)
Publication Type: N/A
Education Level: N/A
Audience: N/A
Language: N/A
Sponsor: Research and Development Centers Branch, DEL.
Authoring Institution: California Univ., Los Angeles. Center for the Study of Evaluation.