ERIC Number: EJ064153
Record Type: CIJE
Publication Date: 1972
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Abstractor: N/A
Reference Count: N/A
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Goodbye IQ, Hello EI (ERTL Index). A Kappan Interview
Phi Delta Kappan, 54, 2, 89-94, Oct 72
Report of an interview with the inventor of the neural efficiency analyzer, reputed to be the first successful culture-free measure of native intelligence. (Author)
Publication Type: N/A
Education Level: N/A
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Sponsor: N/A
Authoring Institution: N/A
Identifiers: ERTL Index; Neural Efficiency Analyzer


