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50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

Learn more about the history of ERIC here. PDF icon

Showing 1 to 15 of 28 results
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Nydick, Steven W. – Journal of Educational and Behavioral Statistics, 2014
The sequential probability ratio test (SPRT) is a common method for terminating item response theory (IRT)-based adaptive classification tests. To decide whether a classification test should stop, the SPRT compares a simple log-likelihood ratio, based on the classification bound separating two categories, to prespecified critical values. As has…
Descriptors: Probability, Item Response Theory, Models, Classification
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Marianti, Sukaesi; Fox, Jean-Paul; Avetisyan, Marianna; Veldkamp, Bernard P.; Tijmstra, Jesper – Journal of Educational and Behavioral Statistics, 2014
Many standardized tests are now administered via computer rather than paper-and-pencil format. In a computer-based testing environment, it is possible to record not only the test taker's response to each question (item) but also the amount of time spent by the test taker in considering and answering each item. Response times (RTs) provide…
Descriptors: Reaction Time, Response Style (Tests), Computer Assisted Testing, Bayesian Statistics
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Wang, Chun – Journal of Educational and Behavioral Statistics, 2014
Many latent traits in social sciences display a hierarchical structure, such as intelligence, cognitive ability, or personality. Usually a second-order factor is linearly related to a group of first-order factors (also called domain abilities in cognitive ability measures), and the first-order factors directly govern the actual item responses.…
Descriptors: Measurement, Accuracy, Item Response Theory, Adaptive Testing
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Wang, Chun; Fan, Zhewen; Chang, Hua-Hua; Douglas, Jeffrey A. – Journal of Educational and Behavioral Statistics, 2013
The item response times (RTs) collected from computerized testing represent an underutilized type of information about items and examinees. In addition to knowing the examinees' responses to each item, we can investigate the amount of time examinees spend on each item. Current models for RTs mainly focus on parametric models, which have the…
Descriptors: Reaction Time, Computer Assisted Testing, Test Items, Accuracy
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Fan, Zhewen; Wang, Chun; Chang, Hua-Hua; Douglas, Jeffrey – Journal of Educational and Behavioral Statistics, 2012
Traditional methods for item selection in computerized adaptive testing only focus on item information without taking into consideration the time required to answer an item. As a result, some examinees may receive a set of items that take a very long time to finish, and information is not accrued as efficiently as possible. The authors propose two…
Descriptors: Computer Assisted Testing, Adaptive Testing, Test Items, Item Analysis
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Wainer, Howard – Journal of Educational and Behavioral Statistics, 2010
In this essay, the author tries to look forward into the 21st century to divine three things: (i) What skills will researchers in the future need to solve the most pressing problems? (ii) What are some of the most likely candidates to be those problems? and (iii) What are some current areas of research that seem mined out and should not distract…
Descriptors: Research Skills, Researchers, Internet, Access to Information
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van der Linden, Wim J. – Journal of Educational and Behavioral Statistics, 2009
A bivariate lognormal model for the distribution of the response times on a test by a pair of test takers is presented. As the model has parameters for the item effects on the response times, its correlation parameter automatically corrects for the spuriousness in the observed correlation between the response times of different test takers because…
Descriptors: Cheating, Models, Reaction Time, Correlation
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Doong, Shing H. – Journal of Educational and Behavioral Statistics, 2009
The purpose of this study is to investigate a functional relation between item exposure parameters (IEPs) and item parameters (IPs) over parallel pools. This functional relation is approximated by a well-known tool in machine learning. Let P and Q be parallel item pools and suppose IEPs for P have been obtained via a Sympson and Hetter-type…
Descriptors: Item Banks, Adaptive Testing, Computer Assisted Testing, Simulation
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Passos, Valeria Lima; Berger, Martijn P. F.; Tan, Frans E. S. – Journal of Educational and Behavioral Statistics, 2008
During the early stage of computerized adaptive testing (CAT), item selection criteria based on Fisher"s information often produce less stable latent trait estimates than the Kullback-Leibler global information criterion. Robustness against early stage instability has been reported for the D-optimality criterion in a polytomous CAT with the…
Descriptors: Computer Assisted Testing, Adaptive Testing, Evaluation Criteria, Item Analysis
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Finkelman, Matthew – Journal of Educational and Behavioral Statistics, 2008
Sequential mastery testing (SMT) has been researched as an efficient alternative to paper-and-pencil testing for pass/fail examinations. One popular method for determining when to cease examination in SMT is the truncated sequential probability ratio test (TSPRT). This article introduces the application of stochastic curtailment in SMT to shorten…
Descriptors: Mastery Tests, Sequential Approach, Computer Assisted Testing, Adaptive Testing
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Wainer, Howard; Robinson, Daniel H. – Journal of Educational and Behavioral Statistics, 2007
This article presents an interview with Susan E. Embretson. Embretson attended the University of Minnesota where she received her bachelor's degree in 1967 and earned a PhD in 1973 in psychology. She became an assistant professor at the University of Kansas in 1974 and was promoted to associate professor and full professor. In 2004, she accepted a…
Descriptors: Educational Research, Psychometrics, Cognitive Psychology, Item Response Theory
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van der Linden, Wim J.; Ariel, Adelaide; Veldkamp, Bernard P. – Journal of Educational and Behavioral Statistics, 2006
Test-item writing efforts typically results in item pools with an undesirable correlational structure between the content attributes of the items and their statistical information. If such pools are used in computerized adaptive testing (CAT), the algorithm may be forced to select items with less than optimal information, that violate the content…
Descriptors: Adaptive Testing, Computer Assisted Testing, Test Items, Item Banks
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Nandakumar, Ratna; Roussos, Louis – Journal of Educational and Behavioral Statistics, 2004
A new procedure, CATSIB, for assessing differential item functioning (DIF) on computerized adaptive tests (CATs) is proposed. CATSIB, a modified SIBTEST procedure, matches test takers on estimated ability and controls for impact-induced Type 1 error inflation by employing a CAT version of the IBTEST "regression correction." The performance of…
Descriptors: Evaluation, Adaptive Testing, Computer Assisted Testing, Pretesting
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van der Linden, Wim J.; Veldkamp, Bernard P. – Journal of Educational and Behavioral Statistics, 2004
Item-exposure control in computerized adaptive testing is implemented by imposing item-ineligibility constraints on the assembly process of the shadow tests. The method resembles Sympson and Hetter's (1985) method of item-exposure control in that the decisions to impose the constraints are probabilistic. The method does not, however, require…
Descriptors: Probability, Law Schools, Admission (School), Adaptive Testing
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Yan, Duanli; Lewis, Charles; Stocking, Martha – Journal of Educational and Behavioral Statistics, 2004
It is unrealistic to suppose that standard item response theory (IRT) models will be appropriate for all the new and currently considered computer-based tests. In addition to developing new models, we also need to give attention to the possibility of constructing and analyzing new tests without the aid of strong models. Computerized adaptive…
Descriptors: Nonparametric Statistics, Regression (Statistics), Adaptive Testing, Computer Assisted Testing
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