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Showing all 9 results
Guo, Hongwen; Sinharay, Sandip – Journal of Educational and Behavioral Statistics, 2011
Nonparametric or kernel regression estimation of item response curves (IRCs) is often used in item analysis in testing programs. These estimates are biased when the observed scores are used as the regressor because the observed scores are contaminated by measurement error. Accuracy of this estimation is a concern theoretically and operationally.…
Descriptors: Testing Programs, Measurement, Item Analysis, Error of Measurement
Sinharay, Sandip; Dorans, Neil J. – Journal of Educational and Behavioral Statistics, 2010
The Mantel-Haenszel (MH) procedure (Mantel and Haenszel) is a popular method for estimating and testing a common two-factor association parameter in a 2 x 2 x K table. Holland and Holland and Thayer described how to use the procedure to detect differential item functioning (DIF) for tests with dichotomously scored items. Wang, Bradlow, Wainer, and…
Descriptors: Test Bias, Statistical Analysis, Computation, Bayesian Statistics
Haberman, Shelby J.; Sinharay, Sandip – Journal of Educational and Behavioral Statistics, 2010
Most automated essay scoring programs use a linear regression model to predict an essay score from several essay features. This article applied a cumulative logit model instead of the linear regression model to automated essay scoring. Comparison of the performances of the linear regression model and the cumulative logit model was performed on a…
Descriptors: Scoring, Regression (Statistics), Essays, Computer Software
von Davier, Matthias; Sinharay, Sandip – Journal of Educational and Behavioral Statistics, 2010
This article presents an application of a stochastic approximation expectation maximization (EM) algorithm using a Metropolis-Hastings (MH) sampler to estimate the parameters of an item response latent regression model. Latent regression item response models are extensions of item response theory (IRT) to a latent variable model with covariates…
Descriptors: Item Response Theory, Statistical Analysis, Regression (Statistics), Models
Sinharay, Sandip; Dorans, Neil J.; Grant, Mary C.; Blew, Edwin O. – Journal of Educational and Behavioral Statistics, 2009
Test administrators often face the challenge of detecting differential item functioning (DIF) with samples of size smaller than that recommended by experts. A Bayesian approach can incorporate, in the form of a prior distribution, existing information on the inference problem at hand, which yields more stable estimation, especially for small…
Descriptors: Test Bias, Computation, Bayesian Statistics, Data
von Davier, Matthias; Sinharay, Sandip – Journal of Educational and Behavioral Statistics, 2007
Reporting methods used in large-scale assessments such as the National Assessment of Educational Progress (NAEP) rely on latent regression models. To fit the latent regression model using the maximum likelihood estimation technique, multivariate integrals must be evaluated. In the computer program MGROUP used by the Educational Testing Service for…
Descriptors: Simulation, Computer Software, Sampling, Data Analysis
Sinharay, Sandip – Journal of Educational and Behavioral Statistics, 2006
Bayesian networks are frequently used in educational assessments primarily for learning about students' knowledge and skills. There is a lack of works on assessing fit of Bayesian networks. This article employs the posterior predictive model checking method, a popular Bayesian model checking tool, to assess fit of simple Bayesian networks. A…
Descriptors: Models, Educational Assessment, Diagnostic Tests, Evaluation Methods
Sinharay, Sandip – Journal of Educational and Behavioral Statistics, 2004
There is an increasing use of Markov chain Monte Carlo (MCMC) algorithms for fitting statistical models in psychometrics, especially in situations where the traditional estimation techniques are very difficult to apply. One of the disadvantages of using an MCMC algorithm is that it is not straightforward to determine the convergence of the…
Descriptors: Psychometrics, Mathematics, Inferences, Markov Processes
Sinharay, Sandip; Johnson, Matthew S.; Williamson, David M. – Journal of Educational and Behavioral Statistics, 2003
Item families, which are groups of related items, are becoming increasingly popular in complex educational assessments. For example, in automatic item generation (AIG) systems, a test may consist of multiple items generated from each of a number of item models. Item calibration or scoring for such an assessment requires fitting models that can…
Descriptors: Test Items, Markov Processes, Educational Testing, Probability

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