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Rijmen, Frank; Jeon, Minjeong; von Davier, Matthias; Rabe-Hesketh, Sophia – Journal of Educational and Behavioral Statistics, 2014
Second-order item response theory models have been used for assessments consisting of several domains, such as content areas. We extend the second-order model to a third-order model for assessments that include subdomains nested in domains. Using a graphical model framework, it is shown how the model does not suffer from the curse of…
Descriptors: Item Response Theory, Models, Educational Assessment, Computation
Jeon, Minjeong; Rijmen, Frank; Rabe-Hesketh, Sophia – Journal of Educational and Behavioral Statistics, 2013
The authors present a generalization of the multiple-group bifactor model that extends the classical bifactor model for categorical outcomes by relaxing the typical assumption of independence of the specific dimensions. In addition to the means and variances of all dimensions, the correlations among the specific dimensions are allowed to differ…
Descriptors: Test Bias, Generalization, Models, Item Response Theory
van der Linden, Wim J.; Jeon, Minjeong – Journal of Educational and Behavioral Statistics, 2012
The probability of test takers changing answers upon review of their initial choices is modeled. The primary purpose of the model is to check erasures on answer sheets recorded by an optical scanner for numbers and patterns that may be indicative of irregular behavior, such as teachers or school administrators changing answer sheets after their…
Descriptors: Probability, Models, Test Items, Educational Testing
Jeon, Minjeong; Rabe-Hesketh, Sophia – Journal of Educational and Behavioral Statistics, 2012
In this article, the authors suggest a profile-likelihood approach for estimating complex models by maximum likelihood (ML) using standard software and minimal programming. The method works whenever setting some of the parameters of the model to known constants turns the model into a standard model. An important class of models that can be…
Descriptors: Maximum Likelihood Statistics, Computation, Models, Factor Structure

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