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50 Years of ERIC
50 Years of ERIC
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Peer reviewed Peer reviewed
ERIC Number: EJ605890
Record Type: CIJE
Publication Date: 2000
Pages: N/A
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: ISSN-0022-0671
Family Structure and Parental Involvement in the Intergenerational Parallelism of School Adversity.
Kaplan, Diane S.; Liu, Xiaoru; Kaplan, Howard B.
Journal of Educational Research, v93 n4 p235-44 Mar-Apr 2000
Examined the effects of mothers' negative junior high school experiences on their childrens' junior high school experiences. Mothers first tested in 1971 were subsequently interviewed in the 1990s, along with their children. Results revealed a significant relationship between mothers' negative school experiences and those of their children, which was partially mediated by family characteristics, educational attainment, and parent involvement. (SM)
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: N/A