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50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

Learn more about the history of ERIC here. PDF icon

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Chen, Jinsong; de la Torre, Jimmy; Zhang, Zao – Journal of Educational Measurement, 2013
As with any psychometric models, the validity of inferences from cognitive diagnosis models (CDMs) determines the extent to which these models can be useful. For inferences from CDMs to be valid, it is crucial that the fit of the model to the data is ascertained. Based on a simulation study, this study investigated the sensitivity of various fit…
Descriptors: Models, Psychometrics, Goodness of Fit, Statistical Analysis
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Debeer, Dries; Janssen, Rianne – Journal of Educational Measurement, 2013
Changing the order of items between alternate test forms to prevent copying and to enhance test security is a common practice in achievement testing. However, these changes in item order may affect item and test characteristics. Several procedures have been proposed for studying these item-order effects. The present study explores the use of…
Descriptors: Item Response Theory, Test Items, Test Format, Models
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Shang, Yi – Journal of Educational Measurement, 2012
Growth models are used extensively in the context of educational accountability to evaluate student-, class-, and school-level growth. However, when error-prone test scores are used as independent variables or right-hand-side controls, the estimation of such growth models can be substantially biased. This article introduces a…
Descriptors: Error of Measurement, Statistical Analysis, Regression (Statistics), Simulation
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Zwick, Rebecca; Himelfarb, Igor – Journal of Educational Measurement, 2011
Research has often found that, when high school grades and SAT scores are used to predict first-year college grade-point average (FGPA) via regression analysis, African-American and Latino students, are, on average, predicted to earn higher FGPAs than they actually do. Under various plausible models, this phenomenon can be explained in terms of…
Descriptors: Socioeconomic Status, Grades (Scholastic), Error of Measurement, White Students
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Myford, Carol M.; Wolfe, Edward W. – Journal of Educational Measurement, 2009
In this study, we describe a framework for monitoring rater performance over time. We present several statistical indices to identify raters whose standards drift and explain how to use those indices operationally. To illustrate the use of the framework, we analyzed rating data from the 2002 Advanced Placement English Literature and Composition…
Descriptors: English Literature, Advanced Placement, Measures (Individuals), Writing (Composition)
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Gierl, Mark J.; Cui, Ying; Zhou, Jiawen – Journal of Educational Measurement, 2009
The attribute hierarchy method (AHM) is a psychometric procedure for classifying examinees' test item responses into a set of structured attribute patterns associated with different components from a cognitive model of task performance. Results from an AHM analysis yield information on examinees' cognitive strengths and weaknesses. Hence, the AHM…
Descriptors: Test Items, True Scores, Psychometrics, Algebra