Peer reviewedERIC Number: EJ230972
Record Type: CIJE
Publication Date: 1980-Aug
Pages: N/A
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: N/A
The Application of High-Resolution Electron Microscopy to Problems in Solid State Chemistry: The Exploits of a Peeping TEM.
Eyring, LeRoy
Journal of Chemical Education, v57 n8 p565-68 Aug 1980
Describes methods for using the high-resolution electron microscope in conjunction with other tools to reveal the identity and environment of atoms. Problems discussed include the ultimate structure of real crystalline solids including defect structure and the mechanisms of chemical reactions. (CS)
Publication Type: Journal Articles; Information Analyses
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: Electron Microscopy; Solid State Chemistry


