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50 Years of ERIC
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Peer reviewed Peer reviewed
ERIC Number: EJ303396
Record Type: CIJE
Publication Date: 1984
Pages: N/A
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: N/A
Analytical Chemistry of Surfaces: Part III. Ion Spectroscopy.
Hercules, David M.; Hercules, Shirley H.
Journal of Chemical Education, v61 n7 p592-99 Jul 1984
The fundamentals of two surface techniques--secondary-ion mass spectrometry (SIMS) and ion-scattering spectrometry (ISS)--are discussed. Examples of how these techniques have been applied to surface problems are provided. (JN)
Descriptors: Chemical Analysis, Chemistry, College Science, Higher Education, Instrumentation, Laboratory Procedures, Spectroscopy
Publication Type: Reports - General; Journal Articles
Education Level: N/A
Audience: Teachers; Practitioners
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: National Science Foundation; Spectrometry
Note: For related articles see SE 535 759 (part I) and SE 535 830 (part II).