NotesFAQContact Us
Collection
Advanced
Search Tips
50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

Learn more about the history of ERIC here. PDF icon

Back to results
Peer reviewed Peer reviewed
ERIC Number: EJ717280
Record Type: Journal
Publication Date: 2004-Dec-1
Pages: 17
Abstractor: Author
Reference Count: 0
ISBN: N/A
ISSN: ISSN-0021-9584
Improvements in the Reliability of X-Ray Photoelectron Spectroscopy for Surface Analysis
Powell, Cedric J.
Journal of Chemical Education, v81 n12 p1734 Dec 2004
A survey of progress made over the past ~30 years (1970 - 2004) to improve the reliability of surface analyses by XPS is presented. The basic principles of XPS are very simple yet there is considerable complexity in designing experiments, interpreting data, and analyzing the results for the many different modes of operation and many different types of specimen materials.
Descriptors: Technological Advancement, Spectroscopy, Chemistry, Science Experiments, Science Instruction, Radiology
Journal of Chemical Education, Subscription Department, P.O. Box 1267, Bellmawr, NJ 08099-1267. Web site: http://jchemed.chem.wisc.edu/AboutJCE/contact.html.
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: N/A