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50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

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Peer reviewed Peer reviewed
ERIC Number: EJ717329
Record Type: Journal
Publication Date: 2005-May-1
Pages: 9
Abstractor: Author
Reference Count: 0
ISBN: N/A
ISSN: ISSN-0021-9584
Getting Physical with Your Chemistry: Mechanically Investigating Local Structure and Properties of Surfaces with the Atomic Force Microscope
Heinz, William F.; Hoh, Jan H.
Journal of Chemical Education, v82 n5 p695 May 2005
Atomic force microscope (AFM) investigates mechanically the chemical properties of individual molecules, surfaces, and materials using suitably designed probes. The current state of the art of AFM in terms of imaging, force measurement, and sample manipulation and its application to physical chemistry is discussed.
Descriptors: Laboratory Equipment, Chemistry, Investigations, Molecular Structure
Journal of Chemical Education, Subscription Department, P.O. Box 1267, Bellmawr, NJ 08099-1267. Web site: http://jchemed.chem.wisc.edu/AboutJCE/contact.html.
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: N/A