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50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

Learn more about the history of ERIC here. PDF icon

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Luecht, Richard M. – Journal of Applied Testing Technology, 2013
Assessment engineering is a new way to design and implement scalable, sustainable and ideally lower-cost solutions to the complexities of designing and developing tests. It represents a merger of sorts between cognitive task modeling and engineering design principles--a merger that requires some new thinking about the nature of score scales, item…
Descriptors: Engineering, Test Construction, Test Items, Models
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Parshall, Cynthia G.; Harmes, J. Christine – Journal of Applied Testing Technology, 2009
Many exam programs have begun to include innovative item types in their operational assessments. While innovative item types appear to have great promise for expanding measurement, there can also be genuine challenges to their successful implementation. In this paper we present a set of four activities that can be beneficially incorporated into…
Descriptors: Test Items, Test Construction, Measurement, Educational Assessment
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Sireci, Stephen G. – Journal of Applied Testing Technology, 2009
The articles in this special issue of the "Journal of Applied Testing Technology" represent significant steps forward in the area of evaluating the validity of methods for assessing the educational achievement of students with disabilities. The studies address some of the most difficult student groups to assess--students with learning…
Descriptors: Learning Disabilities, Reading Tests, Evaluation Methods, Special Needs Students
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Abedi, Jamal – Journal of Applied Testing Technology, 2009
English language learners with disabilities (ELLWD) face many challenges in their academic career. Learning a new language and coping with their disabilities create obstacles in their academic progress. Variables relegating accessibility of assessments for students with disabilities and ELL students may seriously hinder the academic performance of…
Descriptors: Reading Achievement, Second Language Learning, Disabilities, Classification
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Camara, Wayne – Journal of Applied Testing Technology, 2009
The five papers in this special issue of the "Journal of Applied Testing Technology" address fundamental issues of validity when tests are modified or accommodations are provided to English Language Learners (ELL) or students with disabilities. Three papers employed differential item functioning (DIF) and factor analysis and found the underlying…
Descriptors: Second Language Learning, Factor Analysis, English (Second Language), Cognitive Ability
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Ferrara, Steve; Perie, Marianne; Johnson, Eugene – Journal of Applied Testing Technology, 2008
Psychometricians continue to introduce new approaches to setting cut scores for educational assessments in an attempt to improve on current methods. In this paper we describe the Item-Descriptor (ID) Matching method, a method based on IRT item mapping. In ID Matching, test content area experts match items (i.e., their judgments about the knowledge…
Descriptors: Test Results, Test Content, Testing Programs, Educational Testing
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Yu, Chong Ho; Jannasch-Pennell, Angel; DiGangi, Samuel – Journal of Applied Testing Technology, 2008
Since the introduction of the "No Child Left Behind Act," assessment has become a pre-dominant theme in the US K-12 system. However, making assessment results understandable and usable for the K-12 teachers has been a challenge. While test technology offered by various vendors has been widely implemented, technology of training for test…
Descriptors: Item Response Theory, Misconceptions, Computer Assisted Instruction, Inservice Teacher Education
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Thompson, Nathan A. – Journal of Applied Testing Technology, 2008
The widespread application of personal computers to educational and psychological testing has substantially increased the number of test administration methodologies available to testing programs. Many of these mediums are referred to by their acronyms, such as CAT, CBT, CCT, and LOFT. The similarities between the acronyms and the methods…
Descriptors: Testing Programs, Psychological Testing, Classification, Educational Testing