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50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

Learn more about the history of ERIC here. PDF icon

Publication Date
In 20150
Since 20140
Since 2011 (last 5 years)0
Since 2006 (last 10 years)0
Since 1996 (last 20 years)2
Descriptor
Item Response Theory2
Chi Square1
Goodness of Fit1
Mathematical Models1
Measurement Techniques1
Models1
Probability1
Source
Journal of Applied Measurement2
Author
Mok, Magdalena1
Smith, Richard M.1
Wright, Benjamin D.1
Publication Type
Information Analyses2
Journal Articles2
Education Level
Audience
Showing all 2 results
Fit Analysis in Latent Trait Measurement Models.
Peer reviewed Peer reviewed
Smith, Richard M. – Journal of Applied Measurement, 2000
Explores the nature of fit and provides a historical overview of fit indices. Focuses on a family of fit indices based on the Pearsonian chi-square approach to fit to show why it is necessary to use a family of standardized indices to understand the relationship between the data and the model. (Author/SLD)
Descriptors: Chi Square, Goodness of Fit, Item Response Theory, Models
Understanding Rasch Measurement: Rasch Models Overview.
Peer reviewed Peer reviewed
Wright, Benjamin D.; Mok, Magdalena – Journal of Applied Measurement, 2000
Presents an overview of Rasch measurement models that begins with a conceptualization of continuous experiences often captured as discrete observations. Discusses the mathematical properties of the Rasch family of models that allow the transformation of discrete deterministic counts into continuous probabilistic abstractions. Also discusses six of…
Descriptors: Item Response Theory, Mathematical Models, Measurement Techniques, Probability