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50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

Learn more about the history of ERIC here. PDF icon

Showing 271 to 278 of 278 results
Peer reviewed Peer reviewed
Gregoire, Jacques – International Journal of Testing, 2001
Studied the factors underlying the aging effects seen on the Wechsler Intelligence Scale for Adults-Revised (WAIS-R) and the scale's third edition (WAIS-III) using the French standardization samples of 1,104 for the WAIS-III and 1,000 for the WAIS-R. Results show that the observed decline in scores for both tests cannot be fully explained with a…
Descriptors: Adults, Age Differences, Foreign Countries, Intelligence Tests
Peer reviewed Peer reviewed
Foxcroft, Cheryl D. – International Journal of Testing, 2001
Considers ways to implement the International Guidelines for Test Use (International Test Commission, 2001) to maximize their intended impact . The process calls for customizing the guidelines for specific assessment contexts and needs and using the guidelines to generate competency standards. (SLD)
Descriptors: Competence, Educational Assessment, International Education, Standards
Peer reviewed Peer reviewed
Maggi, Stefania – International Journal of Testing, 2001
Developed an Italian version of the Self-Description Questionnaire (SDQ-III) and studied the reliability and factorial validity of this translated instrument. Results show that the translated version has psychometric properties similar to those of the original English version. (SLD)
Descriptors: Factor Structure, Foreign Countries, Psychometrics, Reliability
Peer reviewed Peer reviewed
Gierl, Mark J.; Bolt, Daniel M. – International Journal of Testing, 2001
Presents an overview of nonparametric regression as it allies to differential item functioning analysis and then provides three examples to illustrate how nonparametric regression can be applied to multilingual, multicultural data to study group differences. (SLD)
Descriptors: Groups, Item Bias, Nonparametric Statistics, Regression (Statistics)
Peer reviewed Peer reviewed
Gregoire, Jacques – International Journal of Testing, 2001
Standardized the French version of the Wechsler Intelligence Scale for Children, Third Edition (WISC-III) with a standardization sample of 1,120 participants aged 6 to 16 years. A three-factor solution was a better fit than the four-factor solution of the U.S. version. Factors were identified as Verbal Comprehension, Perceptual Organization, and…
Descriptors: Adolescents, Children, Factor Analysis, Factor Structure
Peer reviewed Peer reviewed
Zimmerman, Donald W.; Zumbo, Bruno D. – International Journal of Testing, 2001
Presents a model of tests and measurement that identifies test scores with Hilbert space vectors and true and error components of scores with linear operators. This geometric point of view brings to light relations among elementary concepts in test theory, including reliability, validity, and parallel tests. (Author/SLD)
Descriptors: Models, Probability, Reliability, Scores
Peer reviewed Peer reviewed
Walker, Cindy M. – International Journal of Testing, 2001
Provides a tutorial on differential item functioning (DIF) and reviews DIFPACK, a new software package that is specifically designed to test for the presence of DIF. DIFPACK allows the user to test for standard unidirectional DIF, DIF in dichotomous items, DIF in polytomous items, and disordinal, or crossing, DIF. (SLD)
Descriptors: Computer Software, Identification, Item Bias, Test Items
Peer reviewed Peer reviewed
Childs, Ruth A. – International Journal of Testing, 2001
The book answers practical questions about item response theory (IRT) in four sections: (1) an introduction to the concepts; (2) IRT theories and principles; (3) fundamentals of IRT; and (4) applications of IRT models. The book is useful for anyone trying to learn about IRT and how to use it. (SLD)
Descriptors: Item Response Theory, Models, Psychometrics, Test Items
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