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50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

Learn more about the history of ERIC here. PDF icon

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Lyren, Per-Erik; Hambleton, Ronald K. – International Journal of Testing, 2011
The equal ability distribution assumption associated with the equivalent groups equating design was investigated in the context of a selection test for admission to higher education. The purpose was to assess the consequences for the test-takers in terms of receiving improperly high or low scores compared to their peers, and to find strong…
Descriptors: Evidence, Test Items, Ability Grouping, Item Response Theory
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Robin, Frederic; Sireci, Stephen G.; Hambleton, Ronald K. – International Journal of Testing, 2003
Illustrates how multidimensional scaling (MDS) and differential item functioning (DIF) procedures can be used to evaluate the equivalence of different language versions of an examination. Presents examples of structural differences and DIF across languages. (SLD)
Descriptors: Item Bias, Licensing Examinations (Professions), Multidimensional Scaling, Multilingual Materials
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Oakland, Thomas; Poortinga, Ype H.; Schlegel, Justin; Hambleton, Ronald K. – International Journal of Testing, 2001
Traces the history of the International Test Commission (ITC), reviewing the context in which it was formed, its goals, and major milestones in its development. Suggests ways the ITC may continue to impact test development positively, and introduces this inaugural journal issue. (SLD)
Descriptors: Educational History, Educational Testing, International Education, Test Construction
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Muniz, Jose; Hambleton, Ronald K.; Xing, Dehui – International Journal of Testing, 2001
Studied two procedures for detecting potentially flawed items in translated tests with small samples: (1) conditional item "p" value comparisons; and (2) delta plots. Varied several factors in this simulation study. Findings show that the two procedures can be valuable in identifying flawed test items, especially when the size of the flaws is…
Descriptors: Identification, Sample Size, Simulation, Test Items