NotesFAQContact Us
Collection
Advanced
Search Tips
50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

Learn more about the history of ERIC here. PDF icon

Showing all 3 results
Peer reviewed Peer reviewed
Direct linkDirect link
Gierl, Mark J.; Lai, Hollis – International Journal of Testing, 2012
Automatic item generation represents a relatively new but rapidly evolving research area where cognitive and psychometric theories are used to produce tests that include items generated using computer technology. Automatic item generation requires two steps. First, test development specialists create item models, which are comparable to templates…
Descriptors: Foreign Countries, Psychometrics, Test Construction, Test Items
Peer reviewed Peer reviewed
Direct linkDirect link
Gierl, Mark J.; Alves, Cecilia; Majeau, Renate Taylor – International Journal of Testing, 2010
The purpose of this study is to apply the attribute hierarchy method in an operational diagnostic mathematics program at Grades 3 and 6 to promote cognitive inferences about students' problem-solving skills. The attribute hierarchy method is a psychometric procedure for classifying examinees' test item responses into a set of structured attribute…
Descriptors: Test Items, Student Reaction, Diagnostic Tests, Psychometrics
Peer reviewed Peer reviewed
Gierl, Mark J.; Bolt, Daniel M. – International Journal of Testing, 2001
Presents an overview of nonparametric regression as it allies to differential item functioning analysis and then provides three examples to illustrate how nonparametric regression can be applied to multilingual, multicultural data to study group differences. (SLD)
Descriptors: Groups, Item Bias, Nonparametric Statistics, Regression (Statistics)