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50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

Learn more about the history of ERIC here. PDF icon

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Chae, Soo Eun; Kim, Doyoung; Han, Jae-Ho – IEEE Transactions on Education, 2012
Those items or test characteristics that are likely to result in differential item functioning (DIF) across accommodated test forms in statewide tests have received little attention. An examination of elementary-level student performance across accommodated test forms in a large-scale mathematics assessment revealed DIF variations by grades,…
Descriptors: Test Bias, Mathematics Tests, Testing Accommodations, Elementary School Mathematics