Peer reviewedERIC Number: EJ594281
Record Type: CIJE
Publication Date: 1999
Pages: N/A
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: ISSN-0013-1644
Multiple Approaches to Analyzing Count Data in Studies of Individual Differences: The Propensity for Type I Errors, Illustrated with the Case of Absenteeism Prediction.
Sturman, Michael C.
Educational and Psychological Measurement, v59 n3 p414-30 Jun 1999
Compares eight models for analyzing count data through simulation in the context of prediction of absenteeism to indicate the extent to which each model produces false positives. Results suggest that ordinary least-squares regression does not produce more false positives than expected by chance. The Tobit and Poisson models do yield too many false positives. (SLD)
Descriptors: Attendance, Individual Differences, Least Squares Statistics, Models, Prediction, Simulation
Publication Type: Journal Articles; Reports - Evaluative; Speeches/Meeting Papers
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: Type I Errors
Note: Version of a paper presented at the Annual Meeting of the Academy of Management (1996).
