Findings show that the reliability of GPA depends on three factors: the number of course grades, the average reliability of these grades, and the credit-hour weights. (Authors)

The O-H (Overcontrolled-Hostility) scale was developed to distinguish among normal subjects and groups of extremely assaultive, moderately assaultive and nonviolent prisoners on the basis of 31 MMPI items. (Authors/CB)

Study compares the Rasch and the Guttman models of measurement and thus adds to the description of the characteristics of Rasch's logistic model. Such knowledge is of importance in making decisions as to which model and which statistics should be used in evaluations of tests. (Author/CB)

Purpose of this study is to determine the relative value of three item validation methods which may be employed in the selection of items for inclusion in a test. (Author/CB)

A copy of the computer program, which determines the transformation matrix used to rotate the configuration, the dilation factor, and the translation vector, is available from the first author. (CB)

The theoretical expectations of duality of attitude structure and comparative lack of bipolarity have now been found using both R and Q methodologies. (Author)

The scales of the EPI have both a favorable and an unfavorable psychometric property which is related to the instructions and format of the inventory. (Author)

Study examined models for improving prediction of single and multiple criteria. (Author)

Initial standing in language, reading, intelligence, socioeconomic status, and sex differences did not predict writing ability of third grade children any more accurately for structured than for nonstructured teaching methods, although children who did not spell or read as well as others were able to produce more volume in their writing when…

This report describes the Cognitive Vocational Maturity Test (CVMT), and instrument designed to measure career knowledges and abilities within six areas of the cognitive domain of vocational maturity, as well as offers validity and reliability data. (Authors)