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50 Years of ERIC
50 Years of ERIC
The Education Resources Information Center (ERIC) is celebrating its 50th Birthday! First opened on May 15th, 1964 ERIC continues the long tradition of ongoing innovation and enhancement.

Learn more about the history of ERIC here. PDF icon

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Setzer, J. Carl; Wise, Steven L.; van den Heuvel, Jill R.; Ling, Guangming – Applied Measurement in Education, 2013
Assessment results collected under low-stakes testing situations are subject to effects of low examinee effort. The use of computer-based testing allows researchers to develop new ways of measuring examinee effort, particularly using response times. At the item level, responses can be classified as exhibiting either rapid-guessing behavior or…
Descriptors: Testing, Guessing (Tests), Reaction Time, Test Items
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Wise, Steven L.; Pastor, Dena A.; Kong, Xiaojing J. – Applied Measurement in Education, 2009
Previous research has shown that rapid-guessing behavior can degrade the validity of test scores from low-stakes proficiency tests. This study examined, using hierarchical generalized linear modeling, examinee and item characteristics for predicting rapid-guessing behavior. Several item characteristics were found significant; items with more text…
Descriptors: Guessing (Tests), Achievement Tests, Correlation, Test Items
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Wise, Steven L. – Applied Measurement in Education, 2006
In low-stakes testing, the motivation levels of examinees are often a matter of concern to test givers because a lack of examinee effort represents a direct threat to the validity of the test data. This study investigated the use of response time to assess the amount of examinee effort received by individual test items. In 2 studies, it was found…
Descriptors: Computer Assisted Testing, Motivation, Test Validity, Item Response Theory
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Wise, Steven L.; Kong, Xiaojing – Applied Measurement in Education, 2005
When low-stakes assessments are administered, the degree to which examinees give their best effort is often unclear, complicating the validity and interpretation of the resulting test scores. This study introduces a new method, based on item response time, for measuring examinee test-taking effort on computer-based test items. This measure, termed…
Descriptors: Psychometrics, Validity, Reaction Time, Test Items
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Wise, Steven L.; Finney, Sara J.; Enders, Craig K.; Freeman, Sharon A.; Severance, Donald D. – Applied Measurement in Education, 1999
Examined whether providing item review on a computerized adaptive test could be used by examinees to inflate their scores. Two studies involving 139 undergraduates suggest that examinees are not highly proficient at discriminating item difficulty. A simulation study showed the usefulness of a strategy identified by G. Kingsbury (1996) as a way to…
Descriptors: Adaptive Testing, Computer Assisted Testing, Difficulty Level, Higher Education
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Barnes, Laura L. B.; Wise, Steven L. – Applied Measurement in Education, 1991
One-parameter and three-parameter item response theory (IRT) model estimates were compared with estimates obtained from two modified one-parameter models that incorporated a constant nonzero guessing parameter. Using small-sample simulation data (50, 100, and 200 simulated examinees), modified 1-parameter models were most effective in estimating…
Descriptors: Ability, Achievement Tests, Comparative Analysis, Computer Simulation
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Wise, Steven L.; And Others – Applied Measurement in Education, 1994
The hypothesis that previously found effects of self-adapted testing (SAT) are attributable to examinees' having an increased perception of control over a stressful testing situation was studied with 377 college students who took computerized adaptive tests or SAT. The strongest preference for SAT was seen in individuals with the highest…
Descriptors: Adaptive Testing, College Students, Computer Assisted Testing, Higher Education