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Showing all 7 results
Setzer, J. Carl; Wise, Steven L.; van den Heuvel, Jill R.; Ling, Guangming – Applied Measurement in Education, 2013
Assessment results collected under low-stakes testing situations are subject to effects of low examinee effort. The use of computer-based testing allows researchers to develop new ways of measuring examinee effort, particularly using response times. At the item level, responses can be classified as exhibiting either rapid-guessing behavior or…
Descriptors: Testing, Guessing (Tests), Reaction Time, Test Items
Wise, Steven L.; Pastor, Dena A.; Kong, Xiaojing J. – Applied Measurement in Education, 2009
Previous research has shown that rapid-guessing behavior can degrade the validity of test scores from low-stakes proficiency tests. This study examined, using hierarchical generalized linear modeling, examinee and item characteristics for predicting rapid-guessing behavior. Several item characteristics were found significant; items with more text…
Descriptors: Guessing (Tests), Achievement Tests, Correlation, Test Items
Wise, Steven L. – Applied Measurement in Education, 2006
In low-stakes testing, the motivation levels of examinees are often a matter of concern to test givers because a lack of examinee effort represents a direct threat to the validity of the test data. This study investigated the use of response time to assess the amount of examinee effort received by individual test items. In 2 studies, it was found…
Descriptors: Computer Assisted Testing, Motivation, Test Validity, Item Response Theory
Wise, Steven L.; Kong, Xiaojing – Applied Measurement in Education, 2005
When low-stakes assessments are administered, the degree to which examinees give their best effort is often unclear, complicating the validity and interpretation of the resulting test scores. This study introduces a new method, based on item response time, for measuring examinee test-taking effort on computer-based test items. This measure, termed…
Descriptors: Psychometrics, Validity, Reaction Time, Test Items
Peer reviewedWise, Steven L.; Finney, Sara J.; Enders, Craig K.; Freeman, Sharon A.; Severance, Donald D. – Applied Measurement in Education, 1999
Examined whether providing item review on a computerized adaptive test could be used by examinees to inflate their scores. Two studies involving 139 undergraduates suggest that examinees are not highly proficient at discriminating item difficulty. A simulation study showed the usefulness of a strategy identified by G. Kingsbury (1996) as a way to…
Descriptors: Adaptive Testing, Computer Assisted Testing, Difficulty Level, Higher Education
Peer reviewedBarnes, Laura L. B.; Wise, Steven L. – Applied Measurement in Education, 1991
One-parameter and three-parameter item response theory (IRT) model estimates were compared with estimates obtained from two modified one-parameter models that incorporated a constant nonzero guessing parameter. Using small-sample simulation data (50, 100, and 200 simulated examinees), modified 1-parameter models were most effective in estimating…
Descriptors: Ability, Achievement Tests, Comparative Analysis, Computer Simulation
Peer reviewedWise, Steven L.; And Others – Applied Measurement in Education, 1994
The hypothesis that previously found effects of self-adapted testing (SAT) are attributable to examinees' having an increased perception of control over a stressful testing situation was studied with 377 college students who took computerized adaptive tests or SAT. The strongest preference for SAT was seen in individuals with the highest…
Descriptors: Adaptive Testing, College Students, Computer Assisted Testing, Higher Education

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