Peer reviewedERIC Number: EJ657708
Record Type: CIJE
Publication Date: 2002
Pages: N/A
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: ISSN-0002-9459
Method for the Assessment of Competence and the Definition of Deficiencies of Students in All Levels of the Curriculum.
Supernaw, Robert B.; Mehvar, Reza
American Journal of Pharmaceutical Education, v66 n1 p1-4 Spr 2002
Describes major methods available for determination of cut scores or minimum competencies (the Nedeslsky and Angoff methods) and their application to annual assessments at Texas Tech School of Pharmacy. (EV)
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: Angoff Methods; Nedelsky Method; Texas Tech University


