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ERIC Number: EJ789986
Record Type: Journal
Publication Date: 2008
Pages: 13
Abstractor: Author
ISBN: N/A
ISSN: ISSN-0146-6216
EISSN: N/A
Commingled Samples: A Neglected Source of Bias in Reliability Analysis
Waller, Niels G.
Applied Psychological Measurement, v32 n3 p211-223 2008
Reliability is a property of test scores from individuals who have been sampled from a well-defined population. Reliability indices, such as coefficient and related formulas for internal consistency reliability (KR-20, Hoyt's reliability), yield lower bound reliability estimates when (a) subjects have been sampled from a single population and when (b) test items are congeneric (i.e., when items are sampled from a single latent dimension). However, when samples are commingled--that is, when they are composed of scores that are drawn from multiple populations-- coefficient and related indices can be severely biased. In most cases the bias inflates; in other cases is attenuated. Equations are derived for elucidating this bias in two-group mixture distributions. (Contains 2 figures and 3 notes.)
SAGE Publications. 2455 Teller Road, Thousand Oaks, CA 91320. Tel: 800-818-7243; Tel: 805-499-9774; Fax: 800-583-2665; e-mail: journals@sagepub.com; Web site: http://sagepub.com
Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A