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ERIC Number: EJ739115
Record Type: Journal
Publication Date: 2004-Jun
Pages: 18
Abstractor: Author
ISBN: N/A
ISSN: ISSN-0022-0655
EISSN: N/A
Using Patterns of Summed Scores in Paper-and-Pencil Tests and Computer-Adaptive Tests to Detect Misfitting Item Score Patterns
Meijer, Rob R.
Journal of Educational Measurement, v41 n2 p119-136 Jun 2004
Two new methods have been proposed to determine unexpected sum scores on sub-tests (testlets) both for paper-and-pencil tests and computer adaptive tests. A method based on a conservative bound using the hypergeometric distribution, denoted p, was compared with a method where the probability for each score combination was calculated using a highest density region (HDR). Furthermore, these methods were compared with the standardized log-likelihood statistic with and without a correction for the estimated latent trait value (denoted as l*[z] and l[z], respectively). Data were simulated on the basis of the one-parameter logistic model, and both parametric and non-parametric logistic regression was used to obtain estimates of the latent trait. Results showed that it is important to take the trait level into account when comparing subtest scores. In a nonparametric item response theory (IRT) context, on adapted version of the HDR method was a powerful alterative to p. In a parametric IRT context, results showed that l*[z] had the highest power when the data were simulated conditionally on the estimated latent trait level.
Blackwell Publishing. 350 Main Street, Malden, MA 02148. Tel: 800-835-6770; Tel: 781-388-8599; Fax: 781-388-8232; e-mail: customerservices@blackwellpublishing.com; Web site: http://www.blackwellpublishing.com/jnl_default.asp.
Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A