Peer reviewedERIC Number: EJ717281
Record Type: Journal
Publication Date: 2004-Dec-1
Pages: 16
Abstractor: Author
ISBN: N/A
ISSN: ISSN-0021-9584
EISSN: N/A
Electron Spectroscopy: Applications for Chemical Analysis
Heercules, David M.
Journal of Chemical Education, v81 n12 p1751 Dec 2004
The development of XPS as an effective method for surface analysis during the period 1964-1977 is presented. The study shows that unlike other surface methods, XPS data can be obtained for both conductors and insulators and a variety of samples can be handled effectively, which is one of the major reasons for the popularity of the technique.
Descriptors: Chemistry, Spectroscopy, Science History, Science Education, Structural Analysis (Science)
Journal of Chemical Education, Subscription Department, P.O. Box 1267, Bellmawr, NJ 08099-1267. Web site: http://jchemed.chem.wisc.edu/AboutJCE/contact.html.
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
