Peer reviewedERIC Number: EJ605949
Record Type: CIJE
Publication Date: 2000-Apr
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: ISSN-0013-1644
EISSN: N/A
Psychometrics Versus Datametrics: Comment on Vacha-Haase's "Reliability Generalization" Method and Some "EPM" Editorial Policies.
Sawilowsky, Shlomo S.
Educational and Psychological Measurement, v60 n2 p157-173 Apr 2000
Reviews issues, raised in part because of "Educational and Psychological Measurement" (EPM) policies, regarding "test reliability," which is psychometric terminology, and "score reliability," score-centric terminology. Discusses datametrics and provides a critique of T. Vacha-Haase's proposed meta-analytic reliability generalization via dummy-coded regression. (SLD)
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Note: Special section on "Reliability Generalization."
