ERIC Number: EJ768275
Record Type: Journal
Publication Date: 2007-Jul
Pages: 11
Abstractor: Author
ISBN: N/A
ISSN: ISSN-0022-0167
EISSN: N/A
Testing a Conceptual Model of Working through Self-Defeating Patterns
Wei, Meifen; Ku, Tsun-Yao
Journal of Counseling Psychology, v54 n3 p295-305 Jul 2007
The present study developed and examined a conceptual model of working through self-defeating patterns. Participants were 390 college students at a large midwestern university. Results indicated that self-defeating patterns mediated the relations between attachment and distress. Also, self-esteem mediated the link between self-defeating patterns and depression, whereas social self-efficacy mediated the association between self-defeating patterns and interpersonal distress. A total of 33% of the variance in self-defeating patterns was explained by attachment anxiety and avoidance; 39% of the variance in self-esteem and 13% of the variance in social self-efficacy were explained by self-defeating patterns and/or attachment anxiety; 50% of the variance in depression was explained by attachment anxiety, self-defeating patterns, and self-esteem; 45% of the variance in interpersonal distress was explained by attachment anxiety and avoidance, self-defeating patterns, and social self-efficacy.
Descriptors: Self Efficacy, Depression (Psychology), Failure, College Students, Self Esteem, Low Achievement, Attachment Behavior, Anxiety, Behavior Patterns, Interpersonal Competence, Models
American Psychological Association. Journals Department, 750 First Street NE, Washington, DC 20002-4242. Tel: 800-374-2721; Tel: 202-336-5510; Fax: 202-336-5502; e-mail: order@apa.org; Web site: http://www.apa.org/publications
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: American Psychological Association, Washington, DC.
Grant or Contract Numbers: N/A