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Peer reviewed Peer reviewed
ERIC Number: EJ666900
Record Type: CIJE
Publication Date: 2003
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: ISSN-0002-9505
EISSN: N/A
Frustrated Total Internal Reflection: A Simple Application and Demonstration.
Zanella, F. P.; Magalhaes, D. V.; Oliveira, M. M.; Bianchi, R. F.; Misoguti, L.; Mendonca, C. R.
American Journal of Physics, v71 n5 p494-96 May 2003
Describes the total internal reflection process that occurs when the internal angle of incidence is equal to or greater than the critical angle. Presents a demonstration of the effect of frustrated total internal reflection (FTIR). (YDS)
Descriptors: Higher Education, Light, Optics, Physics, Science Activities, Science Instruction
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A