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ERIC Number: EJ872464
Record Type: Journal
Publication Date: 2010
Pages: 28
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-1557-3060
EISSN: N/A
Value Added to What? How a Ceiling in the Testing Instrument Influences Value-Added Estimation
Koedel, Cory; Betts, Julian
Education Finance and Policy, v5 n1 p54-81 Win 2010
Value-added measures of teacher quality may be sensitive to the quantitative properties of the student tests upon which they are based. This article focuses on the sensitivity of value added to test score ceiling effects. Test score ceilings are increasingly common in testing instruments across the country as education policy continues to emphasize proficiency-based reform. Encouragingly, we show that over a wide range of test score ceiling severity, teachers' value-added estimates are only negligibly influenced by ceiling effects. However, as ceiling conditions approach those found in minimum-competency testing environments, value-added results are significantly altered. We suggest a simple statistical check for ceiling effects.
MIT Press. 238 Main Street Suite 500, Cambridge, MA 02142. Tel: 617-253-2889; Fax: 617-577-1545; e-mail: journals-rights@mit.edu; Web site: http://www.mitpressjournals.org/loi/edfp
Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
IES Funded: Yes
Grant or Contract Numbers: R305A060034; R305A060067
IES Cited: ED544205; ED544674