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ERIC Number: EJ517386
Record Type: CIJE
Publication Date: 1994
Pages: N/A
Abstractor: N/A
Reference Count: 0
ISBN: N/A
ISSN: ISSN-1045-1064
Effects of Multiple-Choice and Short-Answer Tests on Delayed Retention Learning.
Haynie, William J., III
Journal of Technology Education, v6 n1 Fall 1994
Undergraduates (n=187) were given information booklets; experimentals took either a multiple-choice (n=64) or short-answer (n=64) test afterward. Both groups and 60 controls were tested 3 weeks later on new and previously tested information. Both multiple-choice and short-answer tests were better than no test in improving retention. Multiple choice was more effective in promoting retention of previously tested material. (SK)
Descriptors: Higher Education, Multiple Choice Tests, Retention (Psychology), Technology Education
Publication Type: Reports - Research; Journal Articles
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers: Delayed Retention Effect; Short Answer Tests
Note: Available on the World Wide Web from http://scholar.lib.vt.edu/ejournals/JTE/jte.html.