ERIC Number: ED335419
Record Type: RIE
Publication Date: 1991-Jun
Reference Count: N/A
The NELS:88 Second Follow-Up Field Test Report. Volume 2.
Dowd, Kathryn L.; And Others
The Second Follow-Up Field Test (SFUFT) of the National Education Longitudinal Study of 1988 (NELS:88) was conducted in 1990 and 1991 by the National Opinion Research Center and the Educational Testing Service. The SFUFT evaluated free response items (FRIs) for possible inclusion in the Second Follow-Up Main Study (SFUMS) and tested survey instruments, procedures, and forms. This appendix contains copies of the questionnaires that were designed for the four major survey components of the SFUFT (students, dropouts, parents, and school administrators). The four questionnaires include: the 124-item Student Questionnaire, the 100-item Not Currently In School (Dropout) Questionnaire, the 85-item Parent Questionnaire, and the 58-item School Administrator Questionnaire (SAQ). Fifteen proposed Early Graduate supplemental questions are also included. The questionnaires from the field test components have been annotated with descriptive statistics. For categorical variables, frequency and percent distributions are recorded, while means and standard deviations are listed for continuous items. The annotated questionnaires are intended to provide information that allow evaluation of items or groups of items. The descriptive statistics are designed to allow assessment of response variation and may provide some indication of what the frequency of responses might be for a given item when it is included in a main study questionnaire. Statistics presented are unweighted and are not adjusted for missing data. (RLC)
Publication Type: Numerical/Quantitative Data; Tests/Questionnaires
Education Level: N/A
Sponsor: National Center for Education Statistics (ED), Washington, DC.
Authoring Institution: National Opinion Research Center, Chicago, IL.
Identifiers: National Education Longitudinal Study 1988
Note: Volume 2 contains only Appendix E of this report: "Field Test Instruments and Data"; for Volume 1, see TM 017 119.