ERIC Number: ED248252
Record Type: RIE
Publication Date: 1984
Reference Count: 0
Three-Year Planning Data-Base, Vol. III, 1983-84.
Rochester City School District, NY.
In order to extend its usefulness in District planning, the contents of the Rochester data-base have been expanded over the compilation of 1982-83, and its format and content improved. The focus of attention is on districtwide trends rather than on individual school analysis. In order to encourage interpretation by those interested in District assessment, data are presented longitudinally whenever possible and described in the frame of reference of statewide or national research. Data are presented in the following categories: Financial Analysis (costs per pupil), City and District Demography (ethnic distribution, enrollment trends), Achievement (test scores, time-on-task, Regents competency requirements), Attainment (student placement, graduation, test scores), Attendance, Student Mobility, Suspension (short-term, long-term), Student Loss, Special Education (referrals, placement, ethnic enrollment), and Alternative Programs. The Appendices include the Executive Summary of the Preliminary Three-Year Planning Document and the Three-Year Planning Recommendations. (BW)
Descriptors: Academic Achievement, Achievement Tests, Attendance Patterns, Educational Attainment, Educational Planning, Elementary Secondary Education, Ethnic Distribution, Expenditure per Student, Longitudinal Studies, Nontraditional Education, School Demography, School Districts, School Holding Power, School Statistics, Special Education, Student Mobility, Suspension, Test Results
Publication Type: Numerical/Quantitative Data; Reports - Evaluative
Education Level: N/A
Authoring Institution: Rochester City School District, NY.
Identifiers: Metropolitan Achievement Tests; New York State Pupil Evaluation Program; Rochester City School District NY; Scholastic Aptitude Test
Note: This paper received the 1984 American Educational Research Association Division H award for Best School/District Profile. For Volume II, see ED 243 895.